HEED: A Highly Efficient Electromagnetic Fault Detection Scheme.
Roukoz Nabhan, Mohammad Ebrahimabadi, Jean-Luc Danger, Jean-Max Dutertre, Sylvain Guilley, Naghmeh Karimi, Raphael Viera, Iyad Zaarour
Browse the full DATE paper archive.
Roukoz Nabhan, Mohammad Ebrahimabadi, Jean-Luc Danger, Jean-Max Dutertre, Sylvain Guilley, Naghmeh Karimi, Raphael Viera, Iyad Zaarour
Browse the full DATE paper archive.