Automatic Test Configuration and Pattern Generation (ATCPG) for Neuromorphic Chips.
I-Wei Chiu, Xin-Ping Chen, Jennifer Shueh-Inn Hu, James Chien-Mo Li
Browse the full ICCAD paper archive.
I-Wei Chiu, Xin-Ping Chen, Jennifer Shueh-Inn Hu, James Chien-Mo Li
Browse the full ICCAD paper archive.