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James Chien-Mo Li

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

33

Venues

6

Active years

2005–2025

Best venue rank

A*

Where they publish

Papers

33 indexed papers, newest first.

YearVenueTitleAuthors
2025ASPDACEfficient ML-Based Transient Thermal Prediction for 3D-ICs.Yun-Feng Yang, Wei-Shen Wang, Yung-Jen Lee, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li, Jessica Yen, Lang Lin
2025ITCDebugging and Preventing Abnormally High Vmin during Logic Scan Test Bring-up.Min-Hsin Liu, Ding-Wei Cheng, James Chien-Mo Li, Chris Nigh, Szu Huat Goh, Mason Chern, Bing-Han Hsieh, Subhadip Kundu
2025VTSMulti-core Vmin and Worst-core Vmin Prediction using SOMAC.Jeng-Yu Liao, Li-Yang Wang, James Chien-Mo Li, Harry H. Chen
2025VTSML-based Adaptive Wafer Sort to Preserve Diagnostic Information.Yun-Sheng Liu, Min-Hsin Liu, James Chien-Mo Li
2024DACLow-Complexity Algorithmic Test Generation for Neuromorphic Chips.Hsu-Yu Huang, Chu-Yun Hsiao, Tsung-Te Liu, James Chien-Mo Li
2024ETSTest Compression for Neuromorphic Chips.Xin-Ping Chen, Hsu-Yu Huang, Chu-Yun Hsiao, Jennifer Shueh-Inn Hu, James Chien-Mo Li
2024ITCqFD: Coherent and Depolarizing Fault Diagnosis for Quantum Processors.Yen-Wei Li, Cheng-Yun Hsieh, Meng-Chen Wu, James Chien-Mo Li
2023ITCDiagnosis of Systematic Delay Failures Through Subset Relationship Analysis.Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava
2023ITCHigh-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns.Zhe-Jia Liang, Yu-Tsung Wu, Yun-Feng Yang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li
2023VTSVmin Prediction Using Nondestructive Stress Test.Chun Chen, Jeng-Yu Liao, James Chien-Mo Li, Harry H. Chen, Eric Jia-Wei Fang
2023VTSDiagnosis of Quantum Circuits in the NISQ Era.Yu-Min Li, Cheng-Yun Hsieh, Yen-Wei Li, James Chien-Mo Li
2022ICCADAutomatic Test Configuration and Pattern Generation (ATCPG) for Neuromorphic Chips.I-Wei Chiu, Xin-Ping Chen, Jennifer Shueh-Inn Hu, James Chien-Mo Li
2022ITCDiagnosing Double Faulty Chains through Failing Bit Separation.Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern
2022ITCML-Assisted VminBinning with Multiple Guard Bands for Low Power Consumption.Wei-Chen Lin, Chun Chen, Chao-Ho Hsieh, James Chien-Mo Li, Eric Jia-Wei Fang, Sung S.-Y. Hsueh
2021ICCADMachine Learning-Based Test Pattern Generation for Neuromorphic Chips.Hsiao-Yin Tseng, I-Wei Chiu, Mu-Ting Wu, James Chien-Mo Li
2021ITCMinimum Operating Voltage Prediction in Production Test Using Accumulative Learning.Yen-Ting Kuo, Wei-Chen Lin, Chun Chen, Chao-Ho Hsieh, James Chien-Mo Li, Eric Jia-Wei Fang, Sung S.-Y. Hsueh
2021ITCImproving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization.Mu-Ting Wu, Cheng-Sian Kuo, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava
2020DACRealistic Fault Models and Fault Simulation for Quantum Dot Quantum Circuits.Cheng-Yun Hsieh, Chen-Hung Wu, Chia-Hsien Huang, His-Sheng Goan, James Chien-Mo Li
2020ITCqATG: Automatic Test Generation for Quantum Circuits.Chen-Hung Wu, Cheng-Yun Hsieh, Jiun-Yun Li, James Chien-Mo Li
2018DACEfficient multi-layer obstacle-avoiding region-to-region rectilinear steiner tree construction.Run-Yi Wang, Chia-Cheng Pai, Junjie Wang, Hsiang-Ting Wen, Yu-Cheng Pai, Yao-Wen Chang, James Chien-Mo Li, Jie-Hong Roland Jiang
2018ITCTest methodology for PCHB/PCFB Asynchronous Circuits.Ting-Yu Shen, Chia-Cheng Pai, Tsai-Chieh Chen, James Chien-Mo Li, Samuel Pan
2014ETSGPU-based timing-aware test generation for small delay defects.Kuan-Yu Liao, Po-Juei Chen, Ang-Feng Lin, James Chien-Mo Li, Michael S. Hsiao, Laung-Terng Wang
2014ITCDivide and conquer diagnosis for multiple defects.Shih-Min Chao, Po-Juei Chen, Jing-Yu Chen, Po-Hao Chen, Ang-Feng Lin, James Chien-Mo Li, Pei-Ying Hsueh, Chun-Yi Kuo, Ying-Yen Chen, Jih-Nung Li
2013DACGPU-based n-detect transition fault ATPG.Kuan-Yu Liao, Sheng-Chang Hsu, James Chien-Mo Li
2011ITCTest clock domain optimization for peak power supply noise reduction during scan.Jen-Yang Wen, Yu-Chuan Huang, Min-Hong Tsai, Kuan-Yu Liao, James Chien-Mo Li, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Hung-Chun Li
2010DACStatic timing analysis for flexible TFT circuits.Chao-Hsuan Hsu, Chester Liu, En-Hua Ma, James Chien-Mo Li
2010VTSCSER: BISER-based concurrent soft-error resilience.Laung-Terng Wang, Nur A. Touba, Zhigang Jiang, Shianling Wu, Jiun-Lang Huang, James Chien-Mo Li
2009ICCADBIST design optimization for large-scale embedded memory cores.Tzuo-Fan Chien, Wen-Chi Chao, James Chien-Mo Li, Yao-Wen Chang, Kuan-Yu Liao, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng
2008ITCIEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores.Geng-Ming Chiu, James Chien-Mo Li
2008ITCDiagnosis of Logic-to-chain Bridging Faults.Wei-Chih Liu, Wei-Lin Tsai, Hsiu-Ting Lin, James Chien-Mo Li
2007ASPDACCyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies.Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Chien-Mo Li
2006ITCJump Simulation: A Technique for Fast and Precise Scan Chain Fault Diagnosis.Yu-Long Kao, Wei-Shun Chuang, James Chien-Mo Li
2005ITCColumn parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains.Hung-Mao Lin, James Chien-Mo Li