Study on Pass-Fail Prediction for the National Radiological Technologist Examination by Discriminant Analysis Using Mock Examinations.
Hiroyoshi Watanabe, Shigeru Sasaki, Shinsuke Aiko, Shigemi Sakamoto
Browse the full ICCE paper archive.
Hiroyoshi Watanabe, Shigeru Sasaki, Shinsuke Aiko, Shigemi Sakamoto
Browse the full ICCE paper archive.