YOLO-based in-situ Defect Monitoring System for Additive Manufacturing.
Deepika Nikam, Maxime Hudon, Sonya Coleman, Dermot Kerr, Neelesh Kumar Jain, Sagar Nikam
Browse the full INDIN paper archive.
Deepika Nikam, Maxime Hudon, Sonya Coleman, Dermot Kerr, Neelesh Kumar Jain, Sagar Nikam
Browse the full INDIN paper archive.