Neelesh Kumar Jain
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1997–2025
Best venue rank
A*
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | INDIN | YOLO-based in-situ Defect Monitoring System for Additive Manufacturing. | Deepika Nikam, Maxime Hudon, Sonya Coleman, Dermot Kerr, Neelesh Kumar Jain, Sagar Nikam |
| 1997 | ICRA | A feature-less approach to process planning. | Amitabha Mukerjee, Neelesh Kumar Jain |