Low-Cost Linearity Testing of High-Resolution ADCs Using Segmentation Modeling and Partial Polynomial Fitting.
Dengquan Li, Yexin Zhu, Longsheng Wang, Shubin Liu, Zhangming Zhu
Browse the full ISCAS paper archive.
Dengquan Li, Yexin Zhu, Longsheng Wang, Shubin Liu, Zhangming Zhu
Browse the full ISCAS paper archive.