Intrinsic and Database-free Watermarking in ICs by Exploiting Process and Design Dependent Variability in Metal-Oxide-Metal Capacitances.
Ahish Shylendra, Swarup Bhunia, Amit Ranjan Trivedi
Browse the full ISLPED paper archive.
Ahish Shylendra, Swarup Bhunia, Amit Ranjan Trivedi
Browse the full ISLPED paper archive.