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Test Pattern Compaction in VLSI Testers.

VenueAITC

Year1983

ProceedingsITC

DBLP recordconf/itc/Albrow83 ↗

Browse the full ITC paper archive.

Subfields

Artificial Intelligence
Machine Learning
Computer Vision
Natural Language Processing
Security and Privacy
Systems and Networking
Databases and Data Management
Data Science and Information Retrieval

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