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Boundary Scan Testing for Multichip Modules.

Stephen C. Hilla

VenueAITC

Year1992

ProceedingsITC

DBLP recordconf/itc/Hilla92 ↗

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Subfields

Artificial Intelligence
Machine Learning
Computer Vision
Natural Language Processing
Security and Privacy
Systems and Networking
Databases and Data Management
Data Science and Information Retrieval

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