Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
ITC
/
Paper
On modeling faults in FinFET logic circuits.
Yuxi Liu
,
Qiang Xu
Venue
A
ITC
Year
2012
Proceedings
ITC
DBLP record
conf/itc/LiuX12a ↗
Browse the full
ITC paper archive
.