A novel RF self test for a combo SoC on digital ATE with multi-site applications.

Chun-Hsien Peng, ChiaYu Yang, Adonis Tsu, Chung-Jin Tsai, Yosen Chen, C.-Y. Lin, Kai Hong, Kaipon Kao, Paul C. P. Liang, Chao Long Tsai, Charles Chien, H. C. Hwang

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