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A Tract-Specific Framework for White Matter Morphometry Combining Macroscopic and Microscopic Tract Features.

Hui Zhang, Suyash P. Awate, Sandhitsu R. Das, John H. Woo, Elias R. Melhem, James C. Gee, Paul A. Yushkevich

VenueAMICCAI
Year2009
ProceedingsMICCAI (1)

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