Reliability Enhancement of SoCs Based on Dynamic Memory Access Profiling in Conjunction with PVT Monitoring.
Deepak Baranwal, Digvijay Singh, Khanusiya Soyeb, Sidhartha Sankar Rout, Sujay Deb
Browse the full VLSID paper archive.
Deepak Baranwal, Digvijay Singh, Khanusiya Soyeb, Sidhartha Sankar Rout, Sujay Deb
Browse the full VLSID paper archive.