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Paper
Observability-aware Directed Test Generation for Soft Errors and Crosstalk Faults.
Kanad Basu
,
Prabhat Mishra
,
Priyadarsan Patra
Venue
National
VLSID
Year
2013
Proceedings
VLSI Design
DBLP record
conf/vlsid/BasuMP13 ↗
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