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Paper
A New Variable Testability Measure: a Concept for Data-Flow Testability Evaluation.
M. Jamoussi
,
B. Kaminaka
,
D. Mukhedkar
Venue
National
VLSID
Year
1992
Proceedings
VLSI Design
DBLP record
conf/vlsid/JamoussiKM92 ↗
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