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Paper
Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics.
Jiaxing Sun
,
Yun Zheng
,
Qing Ye
,
Tianchun Ye
Venue
National
VLSID
Year
2005
Proceedings
VLSI Design
DBLP record
conf/vlsid/SunZYY05 ↗
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