Design flexibility in seamless coded pattern for localization.
Atsushi Hiyama, Shigeru Saito, Tomohiro Tanikawa, Michitaka Hirose
Browse the full VRST paper archive.
Atsushi Hiyama, Shigeru Saito, Tomohiro Tanikawa, Michitaka Hirose
Browse the full VRST paper archive.