Mechanism behind Information Leakage in Electromagnetic Analysis of Cryptographic Modules.
Takeshi Sugawara, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Akashi Satoh
Browse the full WISA paper archive.
Takeshi Sugawara, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Akashi Satoh
Browse the full WISA paper archive.