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Alan J. Weger

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

11

Venues

5

Active years

2003–2014

Best venue rank

A*

Where they publish

Papers

11 indexed papers, newest first.

YearVenueTitleAuthors
2014ITCCounterfeit IC detection using light emission.Peilin Song, Franco Stellari, Alan J. Weger
2012DATEPower management of multi-core chips: Challenges and pitfalls.Pradip Bose, Alper Buyuktosunoglu, John A. Darringer, Meeta Sharma Gupta, Michael B. Healy, Hans M. Jacobson, Indira Nair, Jude A. Rivers, Jeonghee Shin, Augusto Vega, Alan J. Weger
2011DATEEarly chip planning cockpit.Jeonghee Shin, John A. Darringer, Guojie Luo, Alan J. Weger, Charles L. Johnson
2008DACKeeping hot chips cool: are IC thermal problems hot air?Ruchir Puri, Devadas Varma, Darvin Edwards, Alan J. Weger, Paul D. Franzon, Andrew Yang, Stephen V. Kosonocky
2007ISLPEDThermal-aware task scheduling at the system software level.Jeonghwan Choi, Chen-Yong Cher, Hubertus Franke, Hendrik F. Hamann, Alan J. Weger, Pradip Bose
2007VLSIDTemperature-limited microprocessors: Measurements and design implications.Hendrik F. Hamann, Alan J. Weger, James A. Lacey, Zhigang Hu, Pradip Bose, Erwin B. Cohen, Jamil A. Wakil
2006ITCHigh-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images.Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steven C. Wilson, John Pennings, Richard F. Rizzolo
2005ITCAn advanced optical diagnostic technique of IBM z990 eServer microprocessor.Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus
2004ITCCMOS IC diagnostics using the luminescence of OFF-state leakage currents.Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho
2004ITCA Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current.Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia
2003ITCOptical and Electrical Testing of Latchup in I/O Interface Circuits.Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda