Alfred L. Crouch
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
21
Venues
3
Active years
1989–2022
Best venue rank
A*
Where they publish
Papers
21 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2022 | ITC | IEEE P1687.1: Extending the Network Boundaries for Test. | Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo |
| 2020 | ITC | Modeling Novel Non-JTAG IEEE 1687-Like Architectures. | Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick |
| 2019 | VTS | Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. | Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song |
| 2019 | VTS | Innovative Practices on IEEE 1687.xyz. | Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt |
| 2018 | VTS | Innovative practices on machine learning for emerging applications. | Kareem Madkour, Zhaobo Zhang, Alfred L. Crouch, Peter L. Levin, Eve Hunter, Yu Huang |
| 2016 | DAC | Invited - A box of dots: using scan-based path delay test for timing verification. | Alfred L. Crouch, John C. Potter |
| 2014 | ITC | Board security enhancement using new locking SIB-based architectures. | Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter |
| 2013 | ITC | BA-BIST: Board test from inside the IC out. | Zoe Conroy, Alfred L. Crouch |
| 2012 | ITC | Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. | Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers |
| 2008 | ITC | The Advantages of Limiting P1687 to a Restricted Subset. | Jason Doege, Alfred L. Crouch |
| 2007 | ITC | Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. | Zahi S. Abuhamdeh, Vincent D'Alassandro, Richard Pico, Dale Montrone, Alfred L. Crouch, Andrew Tracy |
| 2007 | ITC | IJTAG: The path to organized instrument connectivity. | Alfred L. Crouch |
| 2006 | ITC | Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. | Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan |
| 2004 | ITC | Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. | Alfred L. Crouch |
| 2002 | ITC | Testing the Tester: What Broke? Where? When? Why? | Alfred L. Crouch |
| 2000 | ITC | Optimization trade-offs for vector volume and test power. | Bahram Pouya, Alfred L. Crouch |
| 1999 | ITC | The testability features of the 3rd generation ColdFire family of microprocessors. | Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran |
| 1997 | ITC | A Case Study of the Test Development for the 2nd Generation ColdFire Microprocessors. | Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason |
| 1994 | ITC | Testabilty Features of the MC 68060 Microprocessor. | Alfred L. Crouch, Matthew Pressly, Joe Circello |
| 1994 | ITC | Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. | Alfred L. Crouch, Rick Ramus, Colin M. Maunder |
| 1989 | ITC | Prototype Testing Simplified by Scannable Buffers and Latches. | Andy Halliday, Greg Young, Alfred L. Crouch |