Amit Nahar
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
18
Venues
6
Active years
2005–2023
Best venue rank
A
Where they publish
Papers
18 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2023 | VTS | Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. | V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris |
| 2022 | VTS | Machine Learning-Based Overkill Reduction through Inter-Test Correlation. | Deepika Neethirajan, V. A. Niranjan, Richard Willis, Amit Nahar, D. Webster, Yiorgos Makris |
| 2019 | DATE | Wafer-Level Adaptive Vmin Calibration Seed Forecasting. | Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris |
| 2018 | VTS | Special session on machine learning: How will machine learning transform test? | Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner |
| 2017 | ISCAS | Wafer-level adaptive trim seed forecasting based on E-tests. | Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris |
| 2016 | ICCAD | A machine learning approach to fab-of-origin attestation. | Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | ISCAS | Harnessing fabrication process signature for predicting yield across designs. | Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | ITC | Harnessing process variations for optimizing wafer-level probe-test flow. | Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | ITC | What we know after twelve years developing and deploying test data analytics solutions. | Kenneth M. Butler, Amit Nahar, W. Robert Daasch |
| 2016 | ITC | Statistical outlier screening as a test solution health monitor. | David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar |
| 2016 | VTS | Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. | Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2015 | ICCAD | Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. | Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2015 | VTS | Yield prognosis for fab-to-fab product migration. | Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris |
| 2014 | ITC | IC laser trimming speed-up through wafer-level spatial correlation modeling. | Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris |
| 2011 | ITC | Die-level adaptive test: Real-time test reordering and elimination. | Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar |
| 2010 | DATE | Adapting to adaptive testing. | Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli |
| 2009 | ICCD | Quality improvement and cost reduction using statistical outlier methods. | Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger |
| 2005 | ITC | Burn-in reduction using principal component analysis. | Amit Nahar, W. Robert Daasch, Suresh Subramaniam |