| 2017 | MDM | SCI-FII: Speculative Conversational Interface Framework for Incremental Inference on Modularized Services. | Jinho Lee, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham |
| 2013 | ICCS | Hardware Acceleration of an Efficient and Accurate Proton Therapy Monte Carlo. | Thomas H. Osiecki, Min-Yu Tsai, Anne E. Gattiker, Damir A. Jamsek, Sani R. Nassif, William Evan Speight, Cliff C. N. Sze |
| 2011 | ITC | Using well/substrate bias manipulation to enhance voltage-test-based defect detection. | Anne E. Gattiker, Phil Nigh |
| 2011 | VTS | Efficient and product-representative timing model validation. | Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham |
| 2004 | ITC | Diagnosis Meets Physical Failure Analysis: How Long can we Succeed? | Anne E. Gattiker |
| 2004 | ITC | Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. | Phil Nigh, Anne E. Gattiker |
| 2003 | ITC | Deformations of IC Structure in Test and Yield Learning. | Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey |
| 2002 | ISCAS | Static timing analysis based circuit-limited-yield estimation. | Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long |
| 2002 | VTS | Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models. | Abhishek Singh, Jim Plusquellic, Anne E. Gattiker |
| 2001 | ITC | Detecting delay faults using power supply transient signal analysis. | Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker |
| 2000 | ITC | Test method evaluation experiments and data. | Phil Nigh, Anne E. Gattiker |
| 1998 | ITC | Current signatures: application [to CMOS]. | Anne E. Gattiker, Wojciech Maly |
| 1998 | ITC | Toward understanding "Iddq-only" fails. | Anne E. Gattiker, Wojciech Maly |
| 1997 | ITC | Current Signatures: Application. | Anne E. Gattiker, Wojciech Maly |
| 1997 | ITC | To DFT or Not to DFT? | Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly |
| 1996 | VTS | Current signatures [VLSI circuit testing]. | Anne E. Gattiker, Wojciech Maly |
| 1994 | ITC | Feasibility Study of Smart Substrate Multichip Modules. | Anne E. Gattiker, Wojciech Maly |