Anne Gattiker
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
3
Active years
2006–2014
Best venue rank
A
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2014 | ITC | Big data and test. | Anne Gattiker |
| 2014 | VTS | Unstructured text: Test analysis techniques applied to non-test problems. | Anne Gattiker |
| 2012 | VTS | An oscillation-based test structure for timing information extraction. | Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham |
| 2011 | VTS | Invited paper: Yin and Yang of embedded sensors for post-scaling-era. | Anne Gattiker |
| 2010 | ICCAD | System-level impact of chip-level failure mechanisms and screens. | Anne Gattiker |
| 2008 | ICCAD | Using test data to improve IC quality and yield. | Anne Gattiker |
| 2008 | ITC | Unraveling Variability for Process/Product Improvement. | Anne Gattiker |
| 2006 | ITC | Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment. | Anne Gattiker, Manjul Bhushan, Mark B. Ketchen |