Anne Meixner
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
2
Active years
1991–2013
Best venue rank
A
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2013 | VTS | An IDDQ BIST approach to characterize phase-locked loop parameters. | Samed Maltabas, Osman Kubilay Ekekon, Kemal Kulovic, Anne Meixner, Martin Margala |
| 2011 | VTS | An industrial case study of analog fault modeling. | Ender Yilmaz, Anne Meixner, Sule Ozev |
| 2008 | ITC | External Loopback Testing Experiences with High Speed Serial Interfaces. | Anne Meixner, Akira Kakizawa, Benoit Provost, Serge Bedwani |
| 2004 | ITC | Elimination of Traditional Functional Testing of Interface Timings at Intel. | Mike Tripp, T. M. Mak, Anne Meixner |
| 2003 | ITC | Elimination of Traditional Functional Testing of Interface Timings at Intel. | Mike Tripp, T. M. Mak, Anne Meixner |
| 1997 | ITC | Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. | Anne Meixner, Jash Banik |
| 1996 | ITC | Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. | Anne Meixner, Jash Banik |
| 1991 | ITC | Fault Modeling for the Testing of Mixed Integrated Circuits. | Anne Meixner, Wojciech Maly |