Atsushi Murakami
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
1986–2000
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | ITC | Selection of potentially testable path delay faults for test generation. | Atsushi Murakami, Seiji Kajihara, Tsutomu Sasao, Irith Pomeranz, Sudhakar M. Reddy |
| 2000 | ITC | On validating data hold times for flip-flops in sequential circuits. | Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara, Atsushi Murakami, Sadami Takeoka, Mitsuyasu Ohta |
| 1986 | ITC | Testing for a Solid-State Color Image Sensor. | T. Noguchi, Atsushi Murakami, Masato Kawai, Y. Hayasaka |