Ben Bennetts
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
3
Active years
1992–2007
Best venue rank
A
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | ETS | Electronics Design-for-Test: Past, Present and Future. | Ben Bennetts |
| 2006 | ETS | New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). | Bill Eklow, Ben Bennetts |
| 2006 | ITC | IEEE P1687: Toward Standardized Access of Embedded Instrumentation. | Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote |
| 2005 | ITC | IJTAG (internal JTAG): a step toward a DFT standard. | Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts |
| 2004 | DATE | Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. | Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts |
| 1992 | ITC | Progress in DFT: A Personal View. | Ben Bennetts |
| 1992 | ITC | Macro Testability: The Results of Production Device Applications. | Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker |