Bob Orr
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
4
Active years
2014–2017
Best venue rank
C
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | ISCAS | Wafer-level adaptive trim seed forecasting based on E-tests. | Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris |
| 2016 | ICCAD | A machine learning approach to fab-of-origin attestation. | Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | ISCAS | Harnessing fabrication process signature for predicting yield across designs. | Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | ITC | Harnessing process variations for optimizing wafer-level probe-test flow. | Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | VTS | Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. | Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2015 | ICCAD | Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. | Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2015 | VTS | Yield prognosis for fab-to-fab product migration. | Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris |
| 2014 | ITC | IC laser trimming speed-up through wafer-level spatial correlation modeling. | Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris |