Cam Lu
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2003–2004
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | ITC | Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski |
| 2003 | VTS | Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. | Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch |