Carlos M. Roman
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1981–1981
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1981 | ITC | Test Generation for Highly Sequential Scan-Testable Circuits Through Logic Transformation. | M. Ray Mercer, Vishwani D. Agrawal, Carlos M. Roman |