Chao-Wen Tseng
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
2
Active years
1998–2004
Best venue rank
National
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | VTS | ELF-Murphy Data on Defects and Test Sets. | Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Franois-Fabien Ferhani, Edward Li, Subhasish Mitra |
| 2002 | VTS | Experimental Results for Slow-Speed Testing. | Chao-Wen Tseng, James Li, Edward J. McCluskey |
| 2001 | ITC | Testing for resistive opens and stuck opens. | Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
| 2001 | ITC | Multiple-output propagation transition fault test. | Chao-Wen Tseng, Edward J. McCluskey |
| 2001 | VTS | MINVDD Testing for Weak CMOS ICs. | Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh |
| 2001 | VTS | An Evaluation of Pseudo Random Testing for Detecting Real Defects. | Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson |
| 2000 | ITC | Stuck-fault tests vs. actual defects. | Edward J. McCluskey, Chao-Wen Tseng |
| 2000 | VTS | Cold Delay Defect Screening. | Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu |
| 1998 | ITC | Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. | Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
| 1998 | VTS | Experimental Results for IDDQ and VLV Testing. | Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey |