Charles F. Hawkins
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
25
Venues
3
Active years
1985–2003
Best venue rank
A
Where they publish
Papers
25 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | ITC | Burn-in Temperature Projections for Deep Sub-micron Technologies. | Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins |
| 2002 | ITC | Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. | Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura |
| 2002 | ITC | Parametric Failures in CMOS ICs - A Defect-Based Analysis. | Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins |
| 2001 | VTS | Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. | Ivan de Pal, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden |
| 2000 | ITC | Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. | Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De |
| 1999 | ISLPED | Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. | Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De |
| 1998 | ITC | CMOS IC reliability indicators and burn-in economics. | Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell |
| 1997 | ITC | Transient Power Supply Voltage (V | Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins |
| 1997 | ITC | Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. | Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins |
| 1995 | ITC | A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. | Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins |
| 1994 | ITC | Defect Classes - An Overdue Paradigm for CMOS IC. | Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson |
| 1993 | ITC | Quality Testing Requires Quality Thinking. | Jerry M. Soden, Charles F. Hawkins |
| 1993 | ITC | A General Purpose I | Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins |
| 1993 | ITC | The Economics of Guardband Placement. | Richard H. Williams, Charles F. Hawkins |
| 1992 | ITC | System Testing: The Future for All of Us. | Charles F. Hawkins |
| 1992 | ITC | Economic Impact of Type I Test Errors at System and Board Levels. | Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins |
| 1992 | ITC | Testing Errors: Data and Calculations in an IC Manufacturing Process. | Richard H. Williams, R. Glenn Wagner, Charles F. Hawkins |
| 1991 | ITC | EE Curriculum - Continuous Process Improvement? | Charles F. Hawkins, Richard H. Williams |
| 1991 | ITC | The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. | Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins |
| 1990 | ITC | Increased CMOS IC stuck-at fault coverage with reduced I | Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins |
| 1990 | ITC | Zero defects or zero stuck-at faults-CMOS IC process improvement with I | Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins |
| 1990 | ITC | Errors in testing. | Richard H. Williams, Charles F. Hawkins |
| 1989 | ITC | CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. | Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins |
| 1986 | ITC | Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. | Jerry M. Soden, Charles F. Hawkins |
| 1985 | ITC | Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. | Jerry M. Soden, Charles F. Hawkins |