Chien-Mo James Li
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
15
Venues
5
Active years
1998–2022
Best venue rank
A*
Where they publish
Papers
15 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2022 | ASPDAC | Vector-based Dynamic IR-drop Prediction Using Machine Learning. | Jia-Xian Chen, Shi-Tang Liu, Yu-Tsung Wu, Mu-Ting Wu, Chien-Mo James Li, Norman Chang, Ying-Shiun Li, Wentze Chuang |
| 2018 | ICCAD | Machine-learning-based dynamic IR drop prediction for ECO. | Yen-Chun Fang, Heng-Yi Lin, Min-Yan Su, Chien-Mo James Li, Eric Jia-Wei Fang |
| 2018 | VTS | IR drop prediction of ECO-revised circuits using machine learning. | Shih-Yao Lin, Yen-Chun Fang, Yu-Ching Li, Yu-Cheng Liu, Tsung-Shan Yang, Shang-Chien Lin, Chien-Mo James Li, Eric Jia-Wei Fang |
| 2017 | DAC | Test Methodology for Dual-rail Asynchronous Circuits. | Kuan-Yen Huang, Ting-Yu Shen, Chien-Mo James Li |
| 2013 | ICCAD | Automatic test pattern generation for delay defects using timed characteristic functions. | Shin-Yann Ho, Shuo-Ren Lin, Ko-Lung Yuan, Chien-Yen Kuo, Kuan-Yu Liao, Jie-Hong R. Jiang, Chien-Mo James Li |
| 2009 | ASPDAC | Fault modeling and testing of retention flip-flops in low power designs. | Bing-Chuan Bai, Augusli Kifli, Chien-Mo James Li, Kun-Cheng Wu |
| 2009 | ITC | Power scan: DFT for power switches in VLSI designs. | Bing-Chuan Bai, Chien-Mo James Li, Augusli Kifli, Even Tsai, Kun-Cheng Wu |
| 2009 | ITC | Very-Low-Voltage testing of amorphous silicon TFT circuits. | Shiue-Tsung Shen, Wei-Hsiao Liu, Chien-Mo James Li, I-Chun Cheng |
| 2005 | VTS | Jump Scan: A DFT Technique for Low Power Testing. | Min-Hao Chiu, Chien-Mo James Li |
| 2004 | VTS | ELF-Murphy Data on Defects and Test Sets. | Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Franois-Fabien Ferhani, Edward Li, Subhasish Mitra |
| 2002 | VTS | Diagnosis of Sequence-Dependent Chips. | Chien-Mo James Li, Edward J. McCluskey |
| 2001 | ITC | Testing for resistive opens and stuck opens. | Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
| 2001 | VTS | Diagnosis of Tunneling Opens. | Chien-Mo James Li, Edward J. McCluskey |
| 2000 | ITC | Testing for tunneling opens. | Chien-Mo James Li, Edward J. McCluskey |
| 1998 | ITC | Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. | Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |