Chris Schuermyer
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
9
Venues
2
Active years
2002–2007
Best venue rank
A
Where they publish
Papers
9 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | VTS | Silicon Evaluation of Static Alternative Fault Models. | Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware |
| 2006 | ITC | A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. | Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware |
| 2005 | ITC | Achieving higher yield through diagnosis-the ASIC perspective. | Chris Schuermyer |
| 2005 | ITC | Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. | Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware |
| 2004 | ITC | In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. | Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler |
| 2004 | ITC | Minimum Testing Requirements to Screen Temperature Dependent Defects. | Chris Schuermyer, Jens Ruffler, W. Robert Daasch |
| 2003 | ITC | Impact of Multiple-Detect Test Patterns on Product Quality. | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
| 2003 | ITC | Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. | Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning |
| 2002 | ITC | Screening MinVDD Outliers Using Feed-Forward Voltage Testing. | Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner |