| 2016 | ITC | Variation and failure characterization through pattern classification of test data from multiple test stages. | Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng |
| 2015 | ICCAD | Pairwise Proximity-Based Features for Test Escape Screening. | Fan Lin, Chun-Kai Hsu, Alberto Giovanni Busetto, Kwang-Ting Cheng |
| 2015 | ITC | AdaTest: An efficient statistical test framework for test escape screening. | Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng |
| 2014 | DATE | Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction. | Shuangyue Zhang, Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng, Hong Wang |
| 2014 | ITC | Feature engineering with canonical analysis for effective statistical tests screening test escapes. | Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng |
| 2013 | ASPDAC | Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs. | Shin-Shiun Chen, Chun-Kai Hsu, Hsiu-Chuan Shih, Jen-Chieh Yeh, Cheng-Wen Wu |
| 2013 | ITC | Test data analytics - Exploring spatial and test-item correlations in production test data. | Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler |