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D. C. L. (Erik) van Geest

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

3

Venues

2

Active years

2001–2004

Best venue rank

A

Where they publish

Papers

3 indexed papers, newest first.

YearVenueTitleAuthors
2004ITCOn-Chip Mixed-Signal Test Structures Re-used for Board Test.Rodger Schuttert, D. C. L. (Erik) van Geest, A. Kumar
2001ETSSystem-level DFT for consumer products.D. C. L. (Erik) van Geest, Frans G. M. de Jong
2001ITCTesting and programming flash memories on assemblies during high volume production.Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers