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Dave Armstrong

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

3

Venues

2

Active years

2007–2020

Best venue rank

A

Where they publish

Papers

3 indexed papers, newest first.

YearVenueTitleAuthors
2020VTSSpecial Session: Test Challenges in a Chiplet Marketplace.Marc Hutner, R. Sethuram, Bapi Vinnakota, Dave Armstrong, A. Copperhall
2016ITCKnown-good-die test methods for large, thin, high-power digital devices.Dave Armstrong, Gary Maier
2007ITCAn FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time.Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma