David Abercrombie
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
5
Active years
2002–2009
Best venue rank
A*
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | DAC | Use of lithography simulation for the calibration of equation-based design rule checks. | David Abercrombie, Fedor Pikus, Cosmin Cazan |
| 2008 | ITC | Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. | Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann |
| 2006 | VLSID | DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. | David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman |
| 2004 | ITC | ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. | Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw |
| 2003 | IJCNN | Modeling CMOS gate characteristics using independent component analysis. | Thaddeus T. Shannon, David Abercrombie, James McNames |
| 2003 | SMC | Semiconductor manufacturing process visualization. | James McNames, David Abercrombie, David Turner, Thaddeus T. Shannon |
| 2003 | SMC | Process monitoring via independent components. | Thaddeus T. Shannon, David Abercrombie, James McNames |
| 2002 | ITC | Isolating and Removing Sources of Variation in Test Data. | David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge |