David E. Lackey
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
5
Active years
2002–2010
Best venue rank
A*
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ITC | Low cost at-speed testing using On-Product Clock Generation compatible with test compression. | Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, R. Malneedi, Thomas J. Snethen, Vikram Iyengar, David E. Lackey, Gary Grise |
| 2007 | ICCAD | Variation-aware performance verification using at-speed structural test and statistical timing. | Vikram Iyengar, Jinjun Xiong, Subbayyan Venkatesan, Vladimir Zolotov, David E. Lackey, Peter A. Habitz, Chandu Visweswariah |
| 2007 | VTS | An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs. | Vikram Iyengar, Kenneth Pichamuthu, Andrew Ferko, Frank Woytowich, David E. Lackey, Gary Grise, Mark Taylor, Mike Degregorio, Steven F. Oakland |
| 2006 | ITC | Efficient Latch and Clock Structures for System-on-Chip Test Flexibility. | David E. Lackey |
| 2003 | ASPDAC | IBM's 50 Million gate ASICs. | Jrgen Koehl, David E. Lackey, George W. Doerre |
| 2003 | DAC | Designing mega-ASICs in nanogate technologies. | David E. Lackey, Paul S. Zuchowski, Jrgen Koehl |
| 2002 | ICCAD | Managing power and performance for System-on-Chip designs using Voltage Islands. | David E. Lackey, Paul S. Zuchowski, Thomas R. Bednar, Douglas W. Stout, Scott W. Gould, John M. Cohn |