Dongok Kim
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
2007–2016
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ITC | A novel diagnostic test generation methodology and its application in production failure isolation. | M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma |
| 2010 | VTS | Defect diagnosis based on DFM guidelines. | Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman |
| 2007 | ITC | Testing for systematic defects based on DFM guidelines. | Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau |