| 2014 | VTS | Innovative practices session 5C: Machine learning and data analysis in test. | Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee |
| 2011 | DATE | Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. | Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir |
| 2011 | ITC | Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study. | Dragoljub Gagi Drmanac, Michael Laisne |
| 2011 | ITC | Forward prediction based on wafer sort data - A case study. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2011 | VTS | Understanding customer returns from a test perspective. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2010 | DAC | Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch. | Nicholas Callegari, Dragoljub Gagi Drmanac, Li-C. Wang, Magdy S. Abadir |
| 2010 | ICCAD | Online selection of effective functional test programs based on novelty detection. | Po-Hsien Chang, Dragoljub Gagi Drmanac, Li-C. Wang |
| 2010 | ITC | Mining AC delay measurements for understanding speed-limiting paths. | Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja |
| 2009 | DAC | Predicting variability in nanoscale lithography processes. | Dragoljub Gagi Drmanac, Frank Liu, Li-C. Wang |
| 2009 | ITC | Minimizing outlier delay test cost in the presence of systematic variability. | Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir |
| 2008 | ITC | A Study of Outlier Analysis Techniques for Delay Testing. | Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang |