E. Weis
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1991–1991
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1991 | ITC | Electromigration Effects in VLSI Due to Various Current Types. | E. Weis, E. Kinsbron, M. Snyder, B. Vogel, N. Croitoru |
| 1991 | VTS | High accelerated lifetime test methods and procedures for VLSI microcircuit interconnection line certification. | E. Weis, E. Kinsbron, G. Chanoch, M. Snyder |