Edmond S. Cooley
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
1997–1999
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1999 | VTS | The Limits of Digital Testing for Dynamic Circuits. | R. Dean Adams, Edmond S. Cooley |
| 1998 | ITC | Quad DCVS dynamic logic fault modeling and testing. | R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen |
| 1997 | ITC | A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. | R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen |