Elham K. Moghaddam
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
4
Active years
2007–2019
Best venue rank
A*
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2019 | ITC | Test Time and Area Optimized BrST Scheme for Automotive ICs. | Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki |
| 2016 | ITC | Minimal area test points for deterministic patterns. | Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer |
| 2016 | ITC | Test point insertion in hybrid test compression/LBIST architectures. | Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
| 2015 | DAC | Design for low test pattern counts. | Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada |
| 2015 | ITC | Embedded deterministic test points for compact cell-aware tests. | Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
| 2014 | ITC | Isometric test compression with low toggling activity. | Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang |
| 2011 | ITC | Low power compression utilizing clock-gating. | Janusz Rajski, Elham K. Moghaddam, Sudhakar M. Reddy |
| 2010 | ITC | Low capture power at-speed test in EDT environment. | Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee, Mark Kassab |
| 2010 | VTS | At-speed scan test with low switching activity. | Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab |
| 2007 | DSD | An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits. | Elham K. Moghaddam, Shaahin Hessabi |