Eonjo Byun
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
2009–2010
Best venue rank
B
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ETS | A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. | Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo |
| 2010 | VTS | Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. | Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo |
| 2009 | ETS | Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. | Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh |