Erik H. Volkerink
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
3
Active years
2001–2005
Best venue rank
A*
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | DAC | Response compaction with any number of unknowns using a new LFSR architecture. | Erik H. Volkerink, Subhasish Mitra |
| 2004 | ITC | Speed Clustering of Integrated Circuits. | Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra |
| 2004 | VTS | ELF-Murphy Data on Defects and Test Sets. | Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Franois-Fabien Ferhani, Edward Li, Subhasish Mitra |
| 2004 | VTS | Delay Defect Screening using Process Monitor Structures. | Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger |
| 2003 | ITC | ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. | Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink |
| 2003 | VTS | Efficient Seed Utilization for Reseeding based Compression. | Erik H. Volkerink, Subhasish Mitra |
| 2002 | ITC | Packet-Based Input Test Data Compression Techniques. | Erik H. Volkerink, Ajay Khoche, Subhasish Mitra |
| 2002 | VTS | Test Vector Compression Using EDA-ATE Synergies. | Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra |
| 2002 | VTS | Test Economics for Multi-site Test with Modern Cost Reduction Techniques. | Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges |
| 2001 | ITC | Tackling test trade-offs from design, manufacturing to market using economic modeling. | Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff |