| 2005 | ITC | Business constraints drive test decisions. | Fidel Muradali |
| 2004 | DATE | From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. | Robert C. Aitken, Fidel Muradali |
| 2003 | ITC | Future ATE: Perspectives & Requirements. | Fidel Muradali |
| 2003 | ITC | Diagnosis in Modern Design - Just the Tip of the Iceberg. | Fidel Muradali |
| 2002 | ITC | The Impact of Outsourcing on Test. | Fidel Muradali |
| 2002 | VTS | Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? | Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark |
| 2002 | VTS | Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? | Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song |
| 2001 | ITC | Power supply transient signal integration circuit. | Chintan Patel, Fidel Muradali, James F. Plusquellic |
| 2000 | VTS | Do I Need this Tool for My Chips to Work? | Fidel Muradali, Andr Ivanov |
| 1999 | ITC | Trends in SLI design and their effect on test. | Robert C. Aitken, Fidel Muradali |
| 1999 | ITC | Defect detection using power supply transient signal analysis. | Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali |
| 1996 | VTS | A self-driven test structure for pseudorandom testing of non-scan sequential circuits. | Fidel Muradali, Janusz Rajski |
| 1990 | ITC | A new procedure for weighted random built-in self-test. | Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie |