Franois-Fabien Ferhani
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
2004–2008
Best venue rank
National
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | VTS | How Many Test Patterns are Useless? | Franois-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh |
| 2006 | ITC | Classifying Bad Chips and Ordering Test Sets. | Franois-Fabien Ferhani, Edward J. McCluskey |
| 2004 | VTS | ELF-Murphy Data on Defects and Test Sets. | Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Franois-Fabien Ferhani, Edward Li, Subhasish Mitra |