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Geoff Shofner

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

3

Venues

3

Active years

2011–2016

Best venue rank

A

Where they publish

Papers

3 indexed papers, newest first.

YearVenueTitleAuthors
2016ITCPutting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture.Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak
2013DATEFault analysis and simulation of large scale industrial mixed-signal circuits.Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev
2011VTSCase Study: Efficient SDD test generation for very large integrated circuits.Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor