Gouri Sankar Kar
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
14
Venues
7
Active years
2017–2025
Best venue rank
A*
Where they publish
Papers
14 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | DATE | InterA-ECC: Interconnect-Aware Error Correction in STT-MRAM. | Surendra Hemaram, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Tommaso Marinelli, Anita Farokhnejad, Gouri Sankar Kar |
| 2024 | ASPDAC | Hard Error Correction in STT-MRAM. | Surendra Hemaram, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Gouri Sankar Kar |
| 2023 | DATE | Device-Aware Test for Back-Hopping Defects in STT-MRAMs. | Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui |
| 2023 | ISCAS | Design Technology co-optimization of 1D-1VCMA to improve read performance for SCM applications. | Mohit Kumar Gupta, Manu Perumkunnil, Dwaipayan Biswas, Saeideh Alinezhad Chamazcoti, Gouri Sankar Kar, Arnaud Furnmont, Julien Ryckaert |
| 2023 | ITC | Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. | Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2021 | DATE | Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2021 | ITC | Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2020 | DATE | Impact of Magnetic Coupling and Density on STT-MRAM Performance. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2020 | ITC | Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2019 | DAC | Process, Circuit and System Co-optimization of Wafer Level Co-Integrated FinFET with Vertical Nanosheet Selector for STT-MRAM Applications. | Trong Huynh Bao, Anabela Veloso, Sushil Sakhare, Philippe Matagne, Julien Ryckaert, Manu Perumkunnil, Davide Crotti, Farrukh Yasin, Alessio Spessot, Arnaud Furnmont, Gouri Sankar Kar, Anda Mocuta |
| 2019 | ETS | Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. | Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar |
| 2019 | ICCD | A Comparative Analysis on the Impact of Bank Contention in STT-MRAM and SRAM Based LLCs. | Timon Evenblij, Christian Tenllado, Manu Perumkunnil, Francky Catthoor, Sushil Sakhare, Peter Debacker, Gouri Sankar Kar, Arnaud Furnmont, Nicolas Bueno, Jos Ignacio Gmez Prez |
| 2018 | DATE | Main memory organization trade-offs with DRAM and STT-MRAM options based on gem5-NVMain simulation frameworks. | Manu Komalan, Oh Hyung Rock, Matthias Hartmann, Sushil Sakhare, Christian Tenllado, Jos Ignacio Gmez, Gouri Sankar Kar, Arnaud Furnmont, Francky Catthoor, Sophiane Senni, David Novo, Abdoulaye Gamati, Lionel Torres |
| 2017 | ISCAS | Cross-layer design and analysis of a low power, high density STT-MRAM for embedded systems. | Manu Komalan, Sushil Sakhare, Trong Huynh Bao, Siddharth Rao, Woojin Kim, Christian Tenllado, Jos Ignacio Gmez, Gouri Sankar Kar, Arnaud Furnmont, Francky Catthoor |